AVR998: Guide to IEC60730 Class B compliance with AVR microcontrollers
.....
.....
March B Test description.
Static Random Access Memories' test is performed using MarchB algorithm. .....
.....
This algorithm can catch the following miss-processes in SRAM areas:
Stuck At Faults (SAF): The bit is stuck at a state and cannot be written.
Transition Faults (TF): Stuck at a state, once in that state. By instance, the bit's value is '1', it can be written to '0' but once at '0' it cannot be set to '1' any more.
Inversions Coupling Faults (CFin): A transition on a bit inverts the state of a second bit.
Idempotent Coupling Faults (CFid): A transition on a bit forces a second bit to a certain state.
Coupling Faults Bridging (BF): Two bits are shorted. The resulting state of those bits is a logical AND or a logical OR between the previous states of those bits.
State Coupling Faults (SCF): A coupled cell is forced to a certain value only if a coupling cell is in a given state.
NOTE: In some very specific configurations of linked faults, some of those faults could be undetected. Those configurations are considered to impact less than 1 part per million.
Getting a fail during this test means that one of the previous faults was found without distinction of kind.