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Тест 1
---[The scan-path lengths of TI DSP's and microcontrollers]-----
The JTAG IR register for a ARM7 or ARM9 device has 4 bits.
The JTAG IR register for a `classic' TI DSP device has 8 bits.
The JTAG IR register for a `IceMaker' TI DSP device has 38 bits.
The JTAG IR register for a C621x or C671x device has 46 bits.
The older TI DSP devices with `classic' emulation
include the C4x, C5x, C8x, C20x, C24x products.
The newer TI DSP devices with `classic' emulation
include the VC33, C54x, C620x and C670x products.
The TI DSP devices with `IceMaker' emulation
include the C27x, C28x, C55x and C64x products.
---[Perform the scan-path length test on the JTAG IR and DR]----
The test for the JTAG IR instruction scan-path length succeeded.
The JTAG IR instruction scan-path length is -16384 bits.
The test for the JTAG DR bypass scan-path length failed.
The many-ones then many-zeros tested length was -16385 bits.
The many-zeros then many-ones tested length was -16384 bits.
The measured scan-path lengths are invalid.
The specific values -16384 and -16384 indicate that an error
exists in the configuration of the link-delay or scan-path.
---[An error has occurred and this utility has aborted]---------
This error is generated by TI's USCIF driver.
The error's value is: `-234'.
The error's title is: `SC_ERR_PTH_MEASURE'.
The error's explanation is:
The measured lengths of the two JTAG scan-paths
are invalid. This indicates that an error exists
in the configuration of the link-delay or scan-path.
Тест 2
---[Perform the scan-path length test on the JTAG IR and DR]----
The test for the JTAG IR instruction scan-path length failed.
The many-ones then many-zeros tested length was -16384 bits.
The many-zeros then many-ones tested length was -16387 bits.
The test for the JTAG DR bypass scan-path length failed.
The many-ones then many-zeros tested length was -16384 bits.
The many-zeros then many-ones tested length was -16387 bits.
The measured scan-path lengths are invalid.
The specific values -16387 and -16387 indicate that an error
exists in the configuration of the link-delay or scan-path.
---[An error has occurred and this utility has aborted]---------
Тест 3
---[Perform the scan-path length test on the JTAG IR and DR]----
The test for the JTAG IR instruction scan-path length failed.
The many-ones then many-zeros tested length was -16384 bits.
The many-zeros then many-ones tested length was -16393 bits.
The test for the JTAG DR bypass scan-path length failed.
The many-ones then many-zeros tested length was -16384 bits.
The many-zeros then many-ones tested length was -16385 bits.
The measured scan-path lengths are invalid.
The specific values -16393 and -16385 indicate that an error
exists in the configuration of the link-delay or scan-path.
---[An error has occurred and this utility has aborted]---------
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